Mohd Hariz Iswan Sinuin Universiti Teknikal Malaysia Melaka
The WaferVision: Integrated Semiconductor Health Analysis (I.S.H.A) system represents a groundbreaking advancement in semiconductor technology evaluation. Designed to address the critical need for comprehensive semiconductor health analysis, I.S.H.A offers an integrated solution that revolutionizes the way semiconductor devices are assessed. By leveraging state-of-the-art vision technology and advanced algorithms, I.S.H.A provides a holistic approach to semiconductor health assessment, encompassing various aspects such as defect detection, performance analysis, and predictive maintenance. Through real-time monitoring and analysis of wafer properties, the system enables early detection of potential issues, thereby minimizing downtime and optimizing semiconductor manufacturing processes. Furthermore, I.S.H.A incorporates machine learning capabilities, allowing it to adapt and evolve based on historical data and changing semiconductor environments. With its unparalleled accuracy, efficiency, and versatility, the WaferVision I.S.H.A system promises to redefine semiconductor health analysis, paving the way for enhanced productivity and reliability in semiconductor manufacturing industries.